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    Titel :

    Accuracy of optical thin film parameter determination based on spectrophotometric data [5188-24]



    Kongress:

    Annual conference, Advanced characterization techniques for optics, semiconductors, and nanotechnologies



    Erscheinungsdatum :

    2003-01-01


    Format / Umfang :

    10 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Reliable determination of wavelength dependence of thin film refractive index [5188-25]

    Tikhonravov, A. V. / Trubetskov, M. K. / Amotchkina, T. V. et al. | British Library Conference Proceedings | 2003


    Absolute high-accuracy deflectometric measurement of topography [5188-39]

    Illemann, J. / International Society for Optical Engineering | British Library Conference Proceedings | 2003


    VUV light-scattering measurements of substrates and thin film coatings [5188-14]

    Hultaker, A. / Gliech, S. / Benkert, N. et al. | British Library Conference Proceedings | 2003


    Mueller matrix polarimeter in 157 nm [5188-18]

    Jin, L. / Kowa, H. / Otani, Y. et al. | British Library Conference Proceedings | 2003


    New magnetic semiconductor sulfospinels with cobalt [5188-47]

    Saifullaeva, D. A. / Solieva, S. F. / International Society for Optical Engineering | British Library Conference Proceedings | 2003