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    Titel :

    Reliable determination of wavelength dependence of thin film refractive index [5188-25]



    Kongress:

    Annual conference, Advanced characterization techniques for optics, semiconductors, and nanotechnologies



    Erscheinungsdatum :

    01.01.2003


    Format / Umfang :

    12 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Accuracy of optical thin film parameter determination based on spectrophotometric data [5188-24]

    Tikhonravov, A. V. / Trubetskov, M. K. / DeBell, G. W. et al. | British Library Conference Proceedings | 2003


    VUV light-scattering measurements of substrates and thin film coatings [5188-14]

    Hultaker, A. / Gliech, S. / Benkert, N. et al. | British Library Conference Proceedings | 2003


    2011-5188 An Integrated Sublimator Driven Coldplate

    Leimkuehler, T. / Kennedy, S. / American Institute of Aeronautics and Astronautics | British Library Conference Proceedings | 2011


    Mueller matrix polarimeter in 157 nm [5188-18]

    Jin, L. / Kowa, H. / Otani, Y. et al. | British Library Conference Proceedings | 2003


    Phase-shifting algorithm via wavelength tuning based on temporal Fourier transform [5188-41]

    Yu, Y. / Zhang, B. / Jiao, Y. et al. | British Library Conference Proceedings | 2003