Reliable determination of wavelength dependence of thin film refractive index [5188-25]
Annual conference, Advanced characterization techniques for optics, semiconductors, and nanotechnologies
2003-01-01
12 pages
Conference paper
English
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Accuracy of optical thin film parameter determination based on spectrophotometric data [5188-24]
British Library Conference Proceedings | 2003
|VUV light-scattering measurements of substrates and thin film coatings [5188-14]
British Library Conference Proceedings | 2003
|Mueller matrix polarimeter in 157 nm [5188-18]
British Library Conference Proceedings | 2003
|New magnetic semiconductor sulfospinels with cobalt [5188-47]
British Library Conference Proceedings | 2003
|Phase-shifting algorithm via wavelength tuning based on temporal Fourier transform [5188-41]
British Library Conference Proceedings | 2003
|