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    Titel :

    VUV light-scattering measurements of substrates and thin film coatings [5188-14]



    Kongress:

    Annual conference, Advanced characterization techniques for optics, semiconductors, and nanotechnologies



    Erscheinungsdatum :

    2003-01-01


    Format / Umfang :

    8 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Characterizing surface roughness of thin films by polarized light scattering (Invited Paper) [5188-33]

    Germer, T. A. / Fasolka, M. J. / International Society for Optical Engineering | British Library Conference Proceedings | 2003


    Reliable determination of wavelength dependence of thin film refractive index [5188-25]

    Tikhonravov, A. V. / Trubetskov, M. K. / Amotchkina, T. V. et al. | British Library Conference Proceedings | 2003


    2011-5188 An Integrated Sublimator Driven Coldplate

    Leimkuehler, T. / Kennedy, S. / American Institute of Aeronautics and Astronautics | British Library Conference Proceedings | 2011


    Accuracy of optical thin film parameter determination based on spectrophotometric data [5188-24]

    Tikhonravov, A. V. / Trubetskov, M. K. / DeBell, G. W. et al. | British Library Conference Proceedings | 2003


    Optimization of optical coatings for the UV/VUV range (Invited Paper) [5188-11]

    Ristau, D. / Gunster, S. / International Society for Optical Engineering | British Library Conference Proceedings | 2003