Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    A review of the emerging SEMI standards for particle scanners [5188-48]



    Kongress:

    Annual conference, Advanced characterization techniques for optics, semiconductors, and nanotechnologies



    Erscheinungsdatum :

    2003-01-01


    Format / Umfang :

    7 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    2011-5188 An Integrated Sublimator Driven Coldplate

    Leimkuehler, T. / Kennedy, S. / American Institute of Aeronautics and Astronautics | British Library Conference Proceedings | 2011


    New magnetic semiconductor sulfospinels with cobalt [5188-47]

    Saifullaeva, D. A. / Solieva, S. F. / International Society for Optical Engineering | British Library Conference Proceedings | 2003


    Mueller matrix polarimeter in 157 nm [5188-18]

    Jin, L. / Kowa, H. / Otani, Y. et al. | British Library Conference Proceedings | 2003


    Radioactive decay of excitations in ZnSe (Te) [5188-45]

    Gordeev, S. I. / Galkin, S. N. / Kostyukevich, S. A. et al. | British Library Conference Proceedings | 2003


    Double-diode configuration of self-calibrating photodiodes [5188-42]

    Guryev, M. / Kupko, A. / Nazarenko, L. et al. | British Library Conference Proceedings | 2003