This paper reports heavy ion, proton, and laser induced single event effects results for a variety of microelectronic devices targeted for possible use in NASA spacecrafts. The compendium covers devices tested within the years of 2010 through 2012.


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    Titel :

    Compendium of Recent Test Results of Single Event Effects Conducted by the Jet Propulsion Laboratory


    Beteiligte:

    Kongress:

    IEEE Nuclear and Space Radiation Effects Conference ; 2012 ; Miami, FL, United States


    Erscheinungsdatum :

    2012-07-16


    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Keine Angabe


    Sprache :

    Englisch





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