This paper reports heavy ion, proton, and laser induced single event effects results for a variety of microelectronic devices targeted for possible use in NASA spacecrafts. The compendium covers devices tested within the years of 2010 through 2012.
Compendium of Recent Test Results of Single Event Effects Conducted by the Jet Propulsion Laboratory
IEEE Nuclear and Space Radiation Effects Conference ; 2012 ; Miami, FL, United States
2012-07-16
Aufsatz (Konferenz)
Keine Angabe
Englisch