This paper reports recent single-event effects results for a variety of microelectronic devices that include an ADC, DAC, supervisory circuit, FIFO and a Viterbi decoder. The data was collected to evaluate these devices for possible use in NASA spacecraft.


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    Titel :

    Results of Single-event Effects Measurements Conducted by the Jet Propulsion Laboratory


    Beteiligte:

    Kongress:

    International Nuclear and Space Radiation Effects Conference ; 2006 ; Jacksonville, FL, United States


    Erscheinungsdatum :

    01.01.2006


    Medientyp :

    Preprint


    Format :

    Keine Angabe


    Sprache :

    Englisch