This paper reports recent single-event latchup results for a variety of microelectronic devices that include an digital, analog, and CMOS. The data was collected to evaluate these devices for possible use in NASA spacecraft.


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    Titel :

    Results of Single-Event Latchup Measurements Conducted by the Jet Propulsion Laboratory


    Beteiligte:

    Kongress:

    2008 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2008) ; 2008 ; Tucson, AZ, United States


    Erscheinungsdatum :

    14.07.2008


    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Keine Angabe


    Sprache :

    Englisch







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