This paper reports recent single-event latchup results for a variety of microelectronic devices that include an digital, analog, and CMOS. The data was collected to evaluate these devices for possible use in NASA spacecraft.
Results of Single-Event Latchup Measurements Conducted by the Jet Propulsion Laboratory
2008 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2008) ; 2008 ; Tucson, AZ, United States
14.07.2008
Aufsatz (Konferenz)
Keine Angabe
Englisch