We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.


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    Titel :

    Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA


    Beteiligte:
    M. V. O'Bryan (Autor:in) / K. A. LaBel (Autor:in) / J. A. Pellish (Autor:in) / J. M. Lauenstein (Autor:in) / C. Marshall (Autor:in)

    Erscheinungsdatum :

    2010


    Format / Umfang :

    12 pages


    Medientyp :

    Report


    Format :

    Keine Angabe


    Sprache :

    Englisch





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