We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.


    Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA


    Contributors:

    Publication date :

    2010


    Size :

    12 pages


    Type of media :

    Report


    Type of material :

    No indication


    Language :

    English




    Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

    O'Bryan, Martha V. / LaBel, Kenneth A. / Pellish, Jonathan A. et al. | IEEE | 2009



    Current Single Event Effects Results for Candidate Spacecraft Electronics for NASA

    M. V. O'Bryan / C. M. Seidleck / M. A. Carts et al. | NTIS | 2004



    Compendium of Current Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA

    Campola, Michael J. / Cochran, Donna J. / Boutte, Alvin J. et al. | NTRS | 2015