We present the results of single events effects (SEE) testing and analysis investigating the effects of radiation on electronics.


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    Titel :

    Compendium of Single Event Effects for Candidate Spacecraft Electronics for NASA


    Beteiligte:

    Kongress:

    2012 Nuclear and Space Radiation Effects Conference (NSREC) ; 2012 ; Miami, FL, United States


    Erscheinungsdatum :

    16.07.2012


    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Keine Angabe


    Sprache :

    Englisch


    Schlagwörter :


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    O'Bryan, Martha V. / LaBel, Kenneth A. / Pellish, Jonathan A. et al. | NTRS | 2010


    Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

    M. V. O'Bryan / K. A. LaBel / J. A. Pellish et al. | NTIS | 2010


    Compendium of Current Single Event Effects for Candidate Spacecraft Electronics for NASA

    O'Bryan, Martha V. / LaBel, Kenneth A. / Chen, Dakai et al. | NTRS | 2015



    Recent Single Event Effects Results for Candidate Spacecraft Electronics for NASA

    M. V. O'Bryan / K. A. LaBel / S. D. Kniffin et al. | NTIS | 2005