We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.


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    Titel :

    Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA


    Beteiligte:

    Kongress:

    Nuclear and Space Radiation Effects Conference (NSREC) Data Workshop ; 2010 ; Denver, CO, United States


    Erscheinungsdatum :

    19.07.2010


    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Keine Angabe


    Sprache :

    Englisch




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