Vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is studied. Devices tested include digital, linear bipolar, and hybrid devices.


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    Titel :

    Recent Single Event Effects Results for Candidate Spacecraft Electronics for NASA


    Beteiligte:
    M. V. O'Bryan (Autor:in) / K. A. LaBel (Autor:in) / S. D. Kniffin (Autor:in) / C. Poivey (Autor:in) / R. L. Ladbury (Autor:in)

    Erscheinungsdatum :

    2005


    Format / Umfang :

    14 pages


    Medientyp :

    Report


    Format :

    Keine Angabe


    Sprache :

    Englisch




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