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    Titel :

    Loss in Coupling Due to Crack in Piezoelectric Wafer Based Sensors and Actuators


    Beteiligte:
    Zhou, Xu (Autor:in) / Chattopadhyay, Aditi (Autor:in)

    Kongress:

    47th AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference



    Erscheinungsdatum :

    01.01.2006




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch




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