In-Situ Imaging of Crack Growth with Piezoelectric Wafer Active Sensors
47th AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference
01.01.2006
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
AIAA-2006-2114 In-Situ Imaging of Crack Growth with Piezoelectric Wafer Active Sensors
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