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    Titel :

    AIAA-2006-2114 In-Situ Imaging of Crack Growth with Piezoelectric Wafer Active Sensors



    Kongress:

    47th, AIAA/ASME/ASCE/AHS/ASC structures, structural dynamics and materials conference ; 2006 ; Newport, R.I



    Erscheinungsdatum :

    01.01.2006


    Format / Umfang :

    22 pages


    Anmerkungen:

    Paper numbers 2006-1600 to 2006-2284 with gaps held



    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    In-Situ Imaging of Crack Growth with Piezoelectric Wafer Active Sensors

    Giurgiutiu, Victor / Jenkins, Christopher / Kendall, James et al. | AIAA | 2006


    In-Situ Imaging of Crack Growth with Piezoelectric-Wafer Active Sensors

    Victor Giurgiutiu / Lingyu Yu / James Kendall et al. | AIAA | 2007



    AIAA-2006-1973 Loss in Coupling Due to Crack in Piezoelectric Wafer Based Sensors and Actuators

    Zhou, X. / Chattopadhyay, A. / American Institute of Aeronautics and Astronautics | British Library Conference Proceedings | 2006


    Nr. 2114

    DataCite | 1886