High Quality Dry Etched InP Semiconductor Laser Facets and Characterization using Atomic Force Microscopy
Annual meeting; 10th, IEEE; Lasers and Electro-Optics Society: LEOS '97 ; 1997 ; San Francisco; CA
01.01.1997
2 pages
Described as proceedings. IEEE cat no: 97CH36057
Aufsatz (Konferenz)
Englisch
LEOS , lasers , IEEE , electro-optics
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