Simultaneous microstress and strain measurement with an optical microscope [4596-37]
Surface inspection using radon transform of projected grating patterns [4596-10]
Multichannel 3D profilometry [4596-27]
Dynamic phase-shift photoelasticity [4596-44]
High-resolution micro-moire methods: principles and applications [4596-40]
Fiber Optic Polarimetric Sensor (FOPS) for dynamic applications [4596-12]
Three-dimensional biofunctional adaptation in human tooth [4512-12]
Micro-moire for thermal deformation investigation in electronics packaging [4596-38]
Effect of input polarization angle on force sensitivity of embedded single-mode polarimetric sensors
Use of Matlab filtering techniques in digital speckle pattern interferometry [4596-45]
Digital moire applications in automated inspection [2347-25]
Micro-moire methods: optical and scanning techniques [4416-10]
Noninvasive detection of plant nutrient stress using fiber optic spectrophotometry [4416-67]
Efficiency optimization approach for two-wavelength diffractive optical elements [4596-29]
Fiber Bragg grating sensor for static and dynamic measurands [4596-18]
Switching property of sol-gel vanadium oxide thin films [4596-04]
Depth-scanning fringe projection: a new technique for absolute phase evaluation [4596-06]
Combined fluorescence decay time and fiber Bragg grating temperature and strain sensing [4596-14]
Intracavity absorption measurements based on a wavelength-tunable fiber laser [4596-26]
Holographic compensation of atmospheric distortions in laser communication systems [4596-19]
Surface profile measurement using a CD optical pickup head [4596-08]
Thin films residual stress measurement by optical profilometry [4596-02]
General phase quantization approach for diffractive optical elements [4596-30]
New sensor for remote interferometry [4596-25]
Lidar imaging in highly turbid water [4596-20]
Properties of PT/P(VDF-TrFE) pyroelectric sensor based on porous SiO~2 substrate [4596-05]
Silica-optical-fiber-based rare-earth-doped sensors [4596-33]
Active industrial surface inspection with the inverse projected-fringe technique [4596-07]