Fourier transform method for phase retrieving from fringe patterns with carrier: window selection [4596-56]
Conference; 2nd, Advanced photonic sensors and applications ; 2000 ; Singapore
2001-01-01
4 pages
Conference paper
English
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
British Library Conference Proceedings | 2001
|DataCite | 1933
Surface inspection using radon transform of projected grating patterns [4596-10]
British Library Conference Proceedings | 2001
|Active industrial surface inspection with the inverse projected-fringe technique [4596-07]
British Library Conference Proceedings | 2001
|Depth-scanning fringe projection: a new technique for absolute phase evaluation [4596-06]
British Library Conference Proceedings | 2001
|