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    Title :

    Fourier transform method for phase retrieving from fringe patterns with carrier: window selection [4596-56]



    Conference:

    Conference; 2nd, Advanced photonic sensors and applications ; 2000 ; Singapore



    Publication date :

    2001-01-01


    Size :

    4 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English





    Nr. 4596

    DataCite | 1933


    Surface inspection using radon transform of projected grating patterns [4596-10]

    Krishnakumar, V. / Asundi, A. K. / SPIE | British Library Conference Proceedings | 2001


    Active industrial surface inspection with the inverse projected-fringe technique [4596-07]

    Kalms, M. K. / Osten, W. / Juptner, W. P. et al. | British Library Conference Proceedings | 2001


    Depth-scanning fringe projection: a new technique for absolute phase evaluation [4596-06]

    Windecker, R. / Korner, K. / Tiziani, H. J. et al. | British Library Conference Proceedings | 2001