Many aspects of single event testing with protons are similar to single event testing with heavy ions. There are two important differences. The primary one is the problem of monitoring the beam intensity. The second problem involves obtaining and monitoring the beam uniformity across the single event target. The beam intensities can lead to problems with total dose damage. Initially the Bendel‐Petersen two parameter semiempirical equation was used to describe the cross‐section curve. This curve was based on data that had very few low energy points. This chapter shows that a variety of devices are fit using the lognormal distribution. It examines that heavy ion upset rates can be determined from the figure of merit and that the figure of merit can be obtained from the limiting proton cross section.

    ion beams; log normal distribution; proton effects


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Optimizing Proton Testing


    Contributors:

    Published in:

    Publication date :

    2011-09-20


    Size :

    7 pages




    Type of media :

    Article/Chapter (Book)


    Type of material :

    Electronic Resource


    Language :

    English




    Testing and Optimizing Hybrids

    Online Contents | 2009




    Proton Testing of the Power PC750

    Guertin, S. / Farmanesh, F. / Swift, G. et al. | NTRS | 2000