Many aspects of single event testing with protons are similar to single event testing with heavy ions. There are two important differences. The primary one is the problem of monitoring the beam intensity. The second problem involves obtaining and monitoring the beam uniformity across the single event target. The beam intensities can lead to problems with total dose damage. Initially the Bendel‐Petersen two parameter semiempirical equation was used to describe the cross‐section curve. This curve was based on data that had very few low energy points. This chapter shows that a variety of devices are fit using the lognormal distribution. It examines that heavy ion upset rates can be determined from the figure of merit and that the figure of merit can be obtained from the limiting proton cross section.

    ion beams; log normal distribution; proton effects


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    Titel :

    Optimizing Proton Testing


    Beteiligte:

    Erschienen in:

    Erscheinungsdatum :

    20.09.2011


    Format / Umfang :

    7 pages




    Medientyp :

    Aufsatz/Kapitel (Buch)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch




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