The Voltammetric In-Situ Profiling System (VIP system) is a sophisticated portable system developed for trace element monitoring. The development of this system involved novel gel integrated microsensors, a submersible voltammetric probe based on advanced microprocessor and telemetry technology, and hardware, firmware, and software for the control of the system. This article details the main features of the novel microsensors and the VIP system developed together with examples of their applications.


    Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Novel voltammetric probe for in-situ trace element monitoring


    Contributors:

    Published in:

    Sea Technology ; 40 , 5 ; 74-79


    Publication date :

    1999


    Size :

    6 Seiten, 9 Quellen



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English