The Voltammetric In-Situ Profiling System (VIP system) is a sophisticated portable system developed for trace element monitoring. The development of this system involved novel gel integrated microsensors, a submersible voltammetric probe based on advanced microprocessor and telemetry technology, and hardware, firmware, and software for the control of the system. This article details the main features of the novel microsensors and the VIP system developed together with examples of their applications.
Novel voltammetric probe for in-situ trace element monitoring
Sea Technology ; 40 , 5 ; 74-79
1999
6 Seiten, 9 Quellen
Aufsatz (Zeitschrift)
Englisch
NTRS
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