The low Earth orbit radiation environment has two significant characteristics that make laboratory simulation exposures difficult; (1) a low dose rate; and (2) many cycles of low-dose accumulation followed by dose-free annealing. Hardness-assurance considerations for this environment are discussed and related to data from the testing of advanced low power Schottky and high-speed CMOS devices.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Total-dose hardness assurance for low Earth orbit


    Additional title:

    Modelluntersuchungen zum Strahlenschutz schneller CMOS-Schaltungen fuer den Einsatz in Satelliten in niedriger Erdumlaufbahn


    Contributors:
    Maurer, R.H. (author) / Suter, J.J. (author)

    Published in:

    IEEE Transactions on Nuclear Science ; NS-34 , 6, PT.1 ; 1757-1762


    Publication date :

    1987


    Size :

    6 Seiten, 10 Quellen



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English




    Radiation Hardness Assurance

    SAE Technical Papers | 2021


    Avionics Radiation Hardness Assurance (RHA) Guidelines

    R. F. Hodson / J. A. Pellish / R. A. Austin et al. | NTIS | 2021


    Avionics Radiation Hardness Assurance (RHA) Guidelines

    Robert F Hodson / Jonathan A Pellish / Rebekah A Austin et al. | NTRS | 2021


    Missile Electronic System Hardness Assurance Program

    Margolis, M. D. / Messenger, G. C. / Fitch, S. H. | IEEE | 1972


    Radiation Hardness Assurance: Evolving for NewSpace

    Campola, Michael J. / Pellish, Jonathan A. | NTRS | 2019