Military electronic systems of increasing reliability, lower maintenance cost (or cost of ownership), and improved performance have become 'necessities' rather than requirements. The ever-increasing use of VHSIC/VLSI technology however is making these 'necessities' into realities by replacement of discrete components and large ICs through various DoD circuit insertion programs. The small size of VLSI devices is not just an end in itself, but is related to lower cost, higher yield, higher reliability potential, and possible elimination of certain maintenance tasks. This explains why DoD is interested in inserting VHSIC/VLSI technology into the active inventory in the FY 86-88 time frame. This paper will address reliability, maintainability, and testability. Discussed are routine avionic equipment failures and their causes and how VHSIC/VLSI can improve the area of reliability, with maintainability/testability as a boot-strap item to this discipline. Further, a graphic illustration will be presented on how mean time to repair (MTTR) has decreased while mean time between failures (MTBF) has increased during the evolution of circuit technology over the past few years.


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    Title :

    R and M attributes of VHSIC/VLSI technology


    Additional title:

    VHSIC/VLSI-Technik verbessert R und M (Zuverlaessigkeit und Instandhaltung)


    Contributors:
    Zins, E. (author) / Smith, G. (author)


    Publication date :

    1987


    Size :

    4 Seiten, 6 Bilder, 8 Quellen


    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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