Electronics components have an increasingly critical role in avionics systems and in the development of future aircraft systems. Prognostics of such components is becoming a very important research field as a result of the need to provide aircraft systems with system level health management information. This paper focuses on a prognostics application for electronics components within avionics systems, and in particular its application to an Isolated Gate Bipolar Transistor (IGBT). This application utilizes the remaining useful life prediction, accomplished by employing the particle filter framework, leveraging data from accelerated aging tests on IGBTs. These tests induced thermal-electrical overstresses by applying thermal cycling to the IGBT devices. In-situ state monitoring, including measurements of steady-state voltages and currents, electrical transients, and thermal transients are recorded and used as potential precursors of failure.


    Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Towards prognostics for electronics components


    Contributors:
    Saha, B. (author) / Celaya, J.R. (author) / Wysocki, P.F. (author) / Goebel, K.F. (author)


    Publication date :

    2009


    Size :

    7 Seiten, 17 Quellen



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Towards prognostics for electronics components

    Saha, Bhaskar / Celaya, Jose R. / Wysocki, Philip F. et al. | IEEE | 2009


    SiC Power Electronics Packaging Prognostics

    Bower, Gregory / Rogan, Chris / Kozlowski, James et al. | IEEE | 2008


    Life consumption monitoring for electronics prognostics

    Mishra, S. / Ganesan, S. / Pecht, M. et al. | IEEE | 2004


    11.0204 Life Consumption Monitoring for Electronics Prognostics

    IEEE | British Library Conference Proceedings | 2004


    Towards Prognostics of Electrolytic Capacitors

    Celaya, Jose / Kulkarni, Chetan / Goebel, Kai et al. | AIAA | 2011