Electronics components have and increasingly critical role in avionics systems and for the development of future aircraft systems. Prognostics of such components is becoming a very important research filed as a result of the need to provide aircraft systems with system level health management. This paper reports on a prognostics application for electronics components of avionics systems, in particular, its application to the Isolated Gate Bipolar Transistor (IGBT). The remaining useful life prediction for the IGBT is based on the particle filter framework, leveraging data from an accelerated aging tests on IGBTs. The accelerated aging test provided thermal-electrical overstress by applying thermal cycling to the device. In-situ state monitoring, including measurements of the steady-state voltages and currents, electrical transients, and thermal transients are recorded and used as potential precursors of failure.


    Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    Prognostics for Electronics Components of Avionics Systems


    Contributors:

    Conference:

    2009 IEEE Aerospace Conference ; 2009 ; Big Sky, MT, United States


    Publication date :

    2009-03-07


    Type of media :

    Conference paper


    Type of material :

    No indication


    Language :

    English




    Why prognostics for avionics?

    Hecht, H. | IEEE | 2006


    Towards Prognostics for Electronics Components

    B. Saha / J. R. Celaya / P. F. Wysocki et al. | NTIS | 2013


    Towards Prognostics for Electronics Components

    Saha, Bhaskar / Celaya, Jose R. / Wysocki, Philip F. et al. | NTRS | 2013


    Towards prognostics for electronics components

    Saha, Bhaskar / Celaya, Jose R. / Wysocki, Philip F. et al. | IEEE | 2009


    Towards prognostics for electronics components

    Saha, B. / Celaya, J.R. / Wysocki, P.F. et al. | Tema Archive | 2009