Custom CMOS ICs are very attractive for automotive applications; in the tough automotive environment, however, reliability hazards due to the 'latch-up' problem are greatly increased and a superior ability to avoid latch-up is therefore required. The purpose of this work is to discuss electrical measurements performed on custom CMOS ICs for automotive applications to verify their ability to avoid latch-up and to identify potentially dangerous technologies. Failure analysis of the structures which presented a high susceptibility to the phenomenon was performed by means of infrared microscopy and digital voltage contrast, which enabled latch-up sites to be located. Layout weaknesses were easily identified and eventual modifications were suggested to designers.


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    Title :

    Latch-up analysis of CMOS integrated circuits for automatic applications


    Additional title:

    Latch-up-Analyse von integrierten CMOS-Schaltungen fuer Anwendungen im Fahrzeug


    Contributors:
    Rocchelli, R. (author) / Lanoni, E. (author)

    Published in:

    Publication date :

    1985


    Size :

    10 Seiten, 10 Bilder, 14 Quellen


    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English




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