Custom CMOS ICs are very attractive for automotive applications; in the tough automotive environment, however, reliability hazards due to the 'latch-up' problem are greatly increased and a superior ability to avoid latch-up is therefore required. The purpose of this work is to discuss electrical measurements performed on custom CMOS ICs for automotive applications to verify their ability to avoid latch-up and to identify potentially dangerous technologies. Failure analysis of the structures which presented a high susceptibility to the phenomenon was performed by means of infrared microscopy and digital voltage contrast, which enabled latch-up sites to be located. Layout weaknesses were easily identified and eventual modifications were suggested to designers.
Latch-up analysis of CMOS integrated circuits for automatic applications
Latch-up-Analyse von integrierten CMOS-Schaltungen fuer Anwendungen im Fahrzeug
Alta Frequenza, English Edition ; 54 , 5 ; 292-301
1985
10 Seiten, 10 Bilder, 14 Quellen
Article (Journal)
English
Development of CMOS integrated circuits
NTRS | 1979
|Latchup in CMOS Integrated Circuits
NTRS | 1985
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