This paper discusses strategies to reduce life cycle costs with emphasis on the digital test portion of a military ATE system. Basic life cycle cost drivers are reviewed followed by a summary of strategies to reduce these costs. The digital test portion of a military ATE system is then described followed by a more detailed analysis of two cost reduction strategies, test throughput improvement and reduction of future modification costs.


    Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    Reducing military digital testing life cycle costs


    Additional title:

    Reduzierung der digitalen Pruefkosten in der Wehrtechnik waehrend der Lebensdauer eines Systems


    Contributors:


    Publication date :

    1983


    Size :

    7 Seiten, 7 Bilder, 3 Tabellen


    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Reducing Life Cycle Costs of main line interlocking

    Blaauboer, Michiel / Mennen, Wendi / van der Werff, Maarten | IuD Bahn | 2013


    Reducing life cycle costs of main line interlockings

    Blaauboer, Michael / Menne, Wendi / Werff, Maarten van der | Tema Archive | 2013


    A Successful Approach to Reducing Software Life-Cycle Costs

    Erkkinen, T. / SAE | British Library Conference Proceedings | 1998


    Reducing Software Life-Cycle Costs by Developing Configurable Software

    Hagen, C. J. / Brouwers, G. / IEEE; Dayton Section et al. | British Library Conference Proceedings | 1994


    Reducing life-cycle costs with standardised drives for switche

    Bänsch, Roland / Ziemann, Andrea | IuD Bahn | 2011