This paper discusses strategies to reduce life cycle costs with emphasis on the digital test portion of a military ATE system. Basic life cycle cost drivers are reviewed followed by a summary of strategies to reduce these costs. The digital test portion of a military ATE system is then described followed by a more detailed analysis of two cost reduction strategies, test throughput improvement and reduction of future modification costs.
Reducing military digital testing life cycle costs
Reduzierung der digitalen Pruefkosten in der Wehrtechnik waehrend der Lebensdauer eines Systems
1983
7 Seiten, 7 Bilder, 3 Tabellen
Aufsatz (Konferenz)
Englisch
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