This paper discusses strategies to reduce life cycle costs with emphasis on the digital test portion of a military ATE system. Basic life cycle cost drivers are reviewed followed by a summary of strategies to reduce these costs. The digital test portion of a military ATE system is then described followed by a more detailed analysis of two cost reduction strategies, test throughput improvement and reduction of future modification costs.


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    Titel :

    Reducing military digital testing life cycle costs


    Weitere Titelangaben:

    Reduzierung der digitalen Pruefkosten in der Wehrtechnik waehrend der Lebensdauer eines Systems


    Beteiligte:
    Moebus, L.F. (Autor:in)


    Erscheinungsdatum :

    1983


    Format / Umfang :

    7 Seiten, 7 Bilder, 3 Tabellen


    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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