The natural space radiation environment must be considered when microelectronic components are selected for use in space instruments. The designer must be concerned with damage effects due to the total accumulated doses as well as soft upsets and latchup caused by single nuclear events. Methods of estimating the importance of these problems will be discussed and treatments for them will be described.


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    Title :

    Radiation effects in microelectronics for space instruments


    Additional title:

    Strahlungseffekte in der Mikroelektronik fuer Raumfahrtinstrumente


    Contributors:
    Adams, J.H. (author)

    Published in:

    Publication date :

    1983


    Size :

    4 Seiten, 1 Bild, 19 Quellen



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English




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