The natural space radiation environment must be considered when microelectronic components are selected for use in space instruments. The designer must be concerned with damage effects due to the total accumulated doses as well as soft upsets and latchup caused by single nuclear events. Methods of estimating the importance of these problems will be discussed and treatments for them will be described.
Radiation effects in microelectronics for space instruments
Strahlungseffekte in der Mikroelektronik fuer Raumfahrtinstrumente
IEEE Transactions on Nuclear Science ; 30 , 1 ; 481-484
1983
4 Seiten, 1 Bild, 19 Quellen
Aufsatz (Zeitschrift)
Englisch
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