Considerable interest has been generated in the radiation tolerance of certain classes of semiconductor devices that are currently programmed for flight on various Air Force satellites. This interest was initiated by a re-evaluation of the geometrically trapped charged particle fluence that indicate greater radiation exposure during the disturbed or active periods of the solar cycle. Also the ever increasing complexity and hence the sensitivity of integrated circuits that are planned for use in computers and data processing systems on board satellites has created an urgent need to precisely determine the operational lifetimes of these devices during radiation exposures.
Radiation testing complementary (symmetry) metal oxide semiconductor (CMOS) arrays for satellites
Bestrahlungstest von CMOS-Schaltungen fuer Satelliten
IEEE Transactions on Nuclear Science ; 24 , 6 ; 2285-2288
1977
4 Seiten, 8 Tabellen, 10 Quellen
Article (Journal)
English
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