Considerable interest has been generated in the radiation tolerance of certain classes of semiconductor devices that are currently programmed for flight on various Air Force satellites. This interest was initiated by a re-evaluation of the geometrically trapped charged particle fluence that indicate greater radiation exposure during the disturbed or active periods of the solar cycle. Also the ever increasing complexity and hence the sensitivity of integrated circuits that are planned for use in computers and data processing systems on board satellites has created an urgent need to precisely determine the operational lifetimes of these devices during radiation exposures.


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    Titel :

    Radiation testing complementary (symmetry) metal oxide semiconductor (CMOS) arrays for satellites


    Weitere Titelangaben:

    Bestrahlungstest von CMOS-Schaltungen fuer Satelliten


    Beteiligte:
    Matteucci, A.J. (Autor:in) / Schneider, M.F. (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    1977


    Format / Umfang :

    4 Seiten, 8 Tabellen, 10 Quellen



    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Print


    Sprache :

    Englisch




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