The purpose of this paper is establishing the life prediction model of the IGBT modules in traction converter. Firstly, the failure mechanism of IGBTs and the existing life prediction models is described. Then, according to the special working condition of IGBTs inside TC, a bidirectional accelerated aging experiment was designed, and the experiment proved that loss on free-wheeling diode accelerated the IGBT aging. Then, the Weibull distribution was used to fit the data of accelerated aging experiment of IGBTs, and the parameters of the Weibull distribution were solved by the maximum likelihood method and particle swarm algorithm. Finally, the IGBT life prediction model is established according to the Weibull distribution obtained by this experiment.


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    Title :

    Lifetime Prediction Model of IGBT Modules in EMU


    Additional title:

    Lect. Notes Electrical Eng.


    Contributors:
    Jia, Limin (editor) / Qin, Yong (editor) / Liu, Baoming (editor) / Liu, Zhigang (editor) / Diao, Lijun (editor) / An, Min (editor) / Zhu, Benchao (author) / Wang, Lei (author) / Zhang, Lei (author) / Li, Ming (author)

    Conference:

    International Conference on Electrical and Information Technologies for Rail Transportation ; 2019 ; Qingdao, China October 25, 2019 - October 27, 2019



    Publication date :

    2020-04-08


    Size :

    10 pages





    Type of media :

    Article/Chapter (Book)


    Type of material :

    Electronic Resource


    Language :

    English




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