Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Contact dynamics of tapping mode atomic force microscopy



    Published in:

    Publication date :

    2012



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English



    Classification :

    BKL:    33.12 Akustik / 50.36 Technische Akustik / 53.79 Elektroakustik, Tonstudiotechnik / 50.32 Dynamik, Schwingungslehre / 58.56 Lärmschutz, Erschütterungsdämpfung
    Local classification TIB:    275/3425



    Hybrid, Model-Based Tapping Atomic Force Microscope

    Bucher, Izhak / Baruch, Eyal | Springer Verlag | 2025


    Optical Microscopy, Atomic Force Microscopy (AFM) and SNOM

    Birmelin, M. | British Library Online Contents | 1998


    Atomic force microscopy in zero-g

    Friedfeld, R. / Parker, S. / Rodgers, G. et al. | IEEE | 2003


    Atomic Force Microscopy Studies of Fibers

    IEEE; Lasers and Electro-Optics Society | British Library Conference Proceedings | 1994


    Atomic and Scanning Force Microscopy in Space

    Hartmann, E. et al. | British Library Online Contents | 1996