Application of real-time in situ spectroscopic ellipsometry and infrared spectroscopy for characterizing interface structure of a-Si:H layer
Solar energy materials & solar cells ; 66 , 1
2001
Article (Journal)
English
British Library Conference Proceedings | 1994
|Recent developments in spectroscopic ellipsometry for in-situ applications (Invited Paper) [4449-07]
British Library Conference Proceedings | 2001
|British Library Conference Proceedings | 2002
|