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    Title :

    BRIEFS - Electronic Components and Systems - DRAM Circuit Tolerates Single-Event Upsets


    Published in:

    Publication date :

    2000



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    BKL:    50.00 Technik allgemein: Allgemeines / 50.00 / 55.60 Raumfahrttechnik / 55.60



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    Single event upsets in space

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    Robinson, P. | Online Contents | 1994



    Estimating Rates Of Single-Event Upsets

    Zoutendyk, John A. | NTRS | 1988