Short Communication: Easy-to-use Surface Passivation Technique for Bulk Carrier Lifetime Measurements on Silicon Wafers
Progress in photovoltaics ; 6 , 4
1998
Article (Journal)
Unknown
BKL: | 53.36 Energiedirektumwandler, elektrische Energiespeicher |
SHORT COMMUNICATION: Surface passivation by rehydrogenation of silicon-nitride-coated silicon wafers
Online Contents | 2005
|Determination of the bulk lifetime of bare multicrystalline silicon wafers
Online Contents | 2010
|Minority carrier lifetime in plasma-textured silicon wafers for solar cells
Online Contents | 2005
|Effect of PECVD silicon oxynitride film composition on the surface passivation of silicon wafers
Online Contents | 2012
|