The purpose of this testing was to characterize the pulsed-laser-induced single event effect (SEE) susceptibility of the Texas Instruments LM7171 voltage feedback amplifier. The test was conducted at the Naval Research Laboratory using their two-photon absorption (TPA) laser.
Texas Instruments LM7171 Voltage Feedback Amplifier Laser Single-Event Effects Characterization Test Report
2018-07-27
Report
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English