We describe heavy ion test results for two new SEU tolerant latches based on transition nand gates, one for single rail asynchronous and the other for dual rail synchronous designs, implemented in AMI 0.5microprocess.


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    Title :

    SEU Performance of TAG Based Flip Flops


    Contributors:

    Conference:

    Meeting held in Seattle, WA on July 11-15, 2005


    Publication date :

    2005-01-01


    Type of media :

    Conference paper


    Type of material :

    No indication


    Language :

    English




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