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    Title :

    Extreme thermal environmental tests of plastic encapsulated cots


    Contributors:
    Kim, Q. (author) / Okuno, J. O. (author) / Evans, K. C. (author) / Knudson, D. (author) / Mih, D. T. (author) / Gerke, R. D. (author) / Sandor, M. A. (author)

    Conference:

    3rd Annual IEEE Microelctronics Reliability and Qualification Workshop


    Publication date :

    2000-08-17


    Type of media :

    Conference paper


    Type of material :

    No indication


    Language :

    English




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