One of the goals of the Remote Exploration and Experimentation (REE) project at JPL is to determine how vulnerable applications are to single event upsets (SEUs) when run in low radiation space environments using commercial-off-the-shelf (COTS) components.


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    Title :

    Assessing application vulnerability to radiation-induced SEUs in memory


    Contributors:

    Conference:

    International Conference on Dependable Systems and Networks


    Publication date :

    2001-04-01


    Type of media :

    Conference paper


    Type of material :

    No indication


    Language :

    English





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