One of the goals of the Remote Exploration and Experimentation (REE) project at JPL is to determine how vulnerable applications are to single event upsets (SEUs) when run in low radiation space environments using commercial-off-the-shelf (COTS) components.
Assessing application vulnerability to radiation-induced SEUs in memory
International Conference on Dependable Systems and Networks
01.04.2001
Aufsatz (Konferenz)
Keine Angabe
Englisch
Assessing system design for vulnerability to user error
British Library Conference Proceedings | 1999
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