Method of measuring thickness of thin organic liquid film deposited in vacuum involves use of quartz-crystal monitor (QCM) calibrated by use of witness plate that has, in turn, calibrated by measurement of absorption of infrared light in deposited material. Present procedure somewhat tedious, but once calibration accomplished, thicknesses of organic liquid deposits monitored in real time and in situ by use of QCM.
Measuring Thicknesses Of Vacuum-Deposited Organic Thin Films
NASA Tech Briefs ; 20 , 4
1996-04-01
Miscellaneous
No indication
English
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