Method of measuring thickness of thin organic liquid film deposited in vacuum involves use of quartz-crystal monitor (QCM) calibrated by use of witness plate that has, in turn, calibrated by measurement of absorption of infrared light in deposited material. Present procedure somewhat tedious, but once calibration accomplished, thicknesses of organic liquid deposits monitored in real time and in situ by use of QCM.
Measuring Thicknesses Of Vacuum-Deposited Organic Thin Films
NASA Tech Briefs ; 20 , 4
1996-04-01
Sonstige
Keine Angabe
Englisch
Measuring Thicknesses of Vacuum-Deposited Organic Thin Films
Online Contents | 1996
Measuring Thicknesses of Wastewater Films
NTRS | 1987
|Nonlinear Optics and Electroluminescence Using High Vacuum Deposited Organic Thin Films
British Library Conference Proceedings | 1994
|Dielectric properties of vacuum deposited Bi2Te3 thin films
Online Contents | 2005
|Measuring Thicknesses of Coatings on Metals
NTRS | 1986
|