Concise report discusses recent developments in use of semiempirical mathematical models to predict rates of failure and operating lifetimes of complementary metal oxide/semiconductor (CMOS) application-specific integrated circuits (ASIC's). Each model represents specific mechanism of failure. Once failure mechanisms and models relevant to given ASIC chosen, adjustable parameters in models fitted to life-test data acquired from representative integrated-circuit structures on test coupons fabricated along with ASIC's. Then design parameters of ASIC's incorporated into models, and models yield lifetimes.


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    Title :

    Predicting Lifetimes Of CMOS ASIC's From Test Data


    Contributors:

    Published in:

    Publication date :

    1993-08-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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