Concise report discusses recent developments in use of semiempirical mathematical models to predict rates of failure and operating lifetimes of complementary metal oxide/semiconductor (CMOS) application-specific integrated circuits (ASIC's). Each model represents specific mechanism of failure. Once failure mechanisms and models relevant to given ASIC chosen, adjustable parameters in models fitted to life-test data acquired from representative integrated-circuit structures on test coupons fabricated along with ASIC's. Then design parameters of ASIC's incorporated into models, and models yield lifetimes.


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    Titel :

    Predicting Lifetimes Of CMOS ASIC's From Test Data


    Beteiligte:

    Erschienen in:

    Erscheinungsdatum :

    01.08.1993



    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch




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