For space flight hardware, the thermal vacuum environmental test is the best test of a system's flight worthiness. Substituting an atmospheric pressure thermal test for a thermal/vacuum test can effectively reduce piece part temperatures by 20 C or more, even for low power density designs. Similar reductions in test effectiveness can also result from improper assembly level T/V test boundary conditions. The net result of these changes may reduce the effective test temperatures to the point where there is zero or negative margin over the flight thermal environment.
Thermal/vacuum vs. thermal atmospheric testing of space flight electronic assemblies
1990-11-01
Conference paper
No indication
English
Thermal Vacuum Testing of the Capillary Pumped Loop Flight Experiment
SAE Technical Papers | 1994
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