Proposed interferometer combination of sample-point interferometer and equal-path interferometer. Used to monitor optical figures of arrays of mirrors or of segmented mirrors. Incorporation of phase shifting with part of equal-path interferometer renders new interferometer insensitive to vibration and air turbulence. Instrument used over large distances, on ground, or on vibrating structures.


    Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    Equal-Path, Phase-Shifting, Sample-Point Interferometer


    Contributors:

    Published in:

    Publication date :

    1991-04-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




    Present status of the ASET at-wavelength phase-shifting point diffraction interferometer [4146-05]

    Sugisaki, K. / Zhu, Y. / Gomei, Y. et al. | British Library Conference Proceedings | 2000


    Design of a 24-in. phase-shifting interferometer [2870-66]

    Ai, C. / Knowlden, R. E. / Lamb, J. A. et al. | British Library Conference Proceedings | 1996


    Single Frame Phase-Shifting Speckle-Interferometer with a Diffractive Element

    Kranz, J. / Hettwer, A. / Lamprecht, J. et al. | IEEE | 1998


    Design of a 24-in. phase-shifting Fizeau interferometer [2860-50]

    Ai, C. / Knowlden, R. E. / Lamb, J. A. et al. | British Library Conference Proceedings | 1996


    Phase-shifting interferometer using self-pumped phase conjugator with BaTiO~3 [3137-38]

    Sun, C.-C. / Shen, W. / Tsaur, M.-S. et al. | British Library Conference Proceedings | 1997